128C548H01
Semiconductor Devices and Associated Hardware
SEMICONDUCTOR DEVICE,DIODE
128C548H01
5961 - Semiconductor Devices and Associated Hardware
Northrop Grumman Systems Corporation
SEMICONDUCTOR DEVICE,DIODE
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Technical Characteristics
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Maximum Operating Temp Per Measurement Point
150.0 deg celsius ambient air
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Mounting Method
threaded stud
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Current Rating Per Characteristic
4.00 amperes source cutoff current preset and 50.00 amperes source cutoff current outside diameter
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Thread Series Designator
unc
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Voltage Rating In Volts Per Characteristic
70000.0 maximum reverse voltage, peak
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Features Provided
hermetically sealed case
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Semiconductor Material
silicon
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Overall Diameter
1.900 inches nominal
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Overall Length
12.190 inches minimum and 12.310 inches maximum
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Special Features
end contact length 0.50 in. min for anode and 07.0 in. min for cathode; assembly outer dia 1.90 in.
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Terminal Type And Quantity
2 threaded stud
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Test Data Document
97942-128c548 drawing (this is the basic governing drawing, such as a contractor drawing, original equipment manufacturer drawing, etc.; excludes any specification, standard or other document that may be referenced in a basic governing drawing)
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Nominal Thread Size
0.250 inches
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Inclosure Material
metal
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Mounting Facility Quantity
2