JAN1N4751A

Semiconductor Devices and Associated Hardware

SEMICONDUCTOR DEVICE,DIODE

JAN1N4751A

5961-00-098-8669

5961 - Semiconductor Devices and Associated Hardware

Military Specifications

SEMICONDUCTOR DEVICE,DIODE

ACT NOW! SUBMIT A QUICK QUOTE.

Technical Characteristics

  • Test Data Document

    81349-mil-s-19500 specification (includes engineering type bulletins, brochures,etc., that reflect specification type data in specification format; excludes commercial catalogs, industry directories, and similar trade publications, reflecting general type

  • Specification/Standard Data

    81349-mil-s-19500/406 government specification

  • Terminal Length

    0.800 inches minimum and 1.300 inches maximum

  • Current Rating Per Characteristic

    0.48 amperes forward current, average pascal

  • Voltage Rating In Volts Per Characteristic

    30.0 maximum nominal regulator voltage

  • Overall Length

    0.125 inches minimum and 0.160 inches maximum

  • Semiconductor Material

    silicon

  • ~1

    data on certain environmental and performanc

  • Maximum Operating Temp Per Measurement Point

    175.0 deg celsius ambient air

  • Features Provided

    hermetically sealed case

  • Power Rating Per Characteristic

    1.5 watts small-signal input power, common-collector preset

  • Terminal Type And Quantity

    2 uninsulated wire lead

  • Inclosure Material

    glass

  • Overall Diameter

    0.060 inches minimum and 0.085 inches maximum

  • Mounting Method

    terminal

Certified to
AS6081 Methods

Implementing Quality Procurement

A rigorous vendor selection process and vendor management system are essential to ensuring quality.
Read more...

Supplying Quality Products

We take every measure to ensure that we supply quality, authentic parts including a strict vendor selection process and rigorous product inspections..
Read more...

Providing Quality People

Our team of dedicated account managers, procurement professionals and specialized inspectors is the most valuable resource we have.
Read more...