SN7492J

Microcircuits, Electronic

MICROCIRCUIT,DIGITAL

SN7492J

5962-00-223-1694

5962 - Microcircuits, Electronic

Texas Instruments Incorporated

MICROCIRCUIT,DIGITAL

ACT NOW! SUBMIT A QUICK QUOTE.

Technical Characteristics

  • Test Data Document

    00752-373712 drawing (this is the basic governing drawing, such as a contractor drawing, original equipment manufacturer drawing, etc.; excludes any specification, standard or other document that may be referenced in a basic governing drawing)

  • Body Length

    0.660 inches minimum and 0.785 inches maximum

  • Inclosure Configuration

    dual-in-line

  • Case Outline Source And Designator

    t0-116 joint electron device engineering council

  • Output Logic Form

    transistor-transistor logic

  • Operating Temp Range

    +0.0/+85.0 deg celsius

  • Bit Quantity (Non-Core)

    12

  • Body Width

    0.220 inches minimum and 0.280 inches maximum

  • Body Height

    0.140 inches minimum and 0.180 inches maximum

  • Storage Temp Range

    -65.0/+150.0 deg celsius

  • Time Rating Per Chacteristic

    100.00 nanoseconds maximum propagation delay time, low to high level output and 100.00 nanoseconds maximum propagation delay time, high to low level output

  • Maximum Power Dissipation Rating

    130.0 milliwatts

  • Features Provided

    positive outputs and hermetically sealed and monolithic and w/enable and resettable and edge triggered

  • Inclosure Material

    ceramic and glass

  • Input Circuit Pattern

    4 input

Certified to
AS6081 Methods

Implementing Quality Procurement

A rigorous vendor selection process and vendor management system are essential to ensuring quality.
Read more...

Supplying Quality Products

We take every measure to ensure that we supply quality, authentic parts including a strict vendor selection process and rigorous product inspections..
Read more...

Providing Quality People

Our team of dedicated account managers, procurement professionals and specialized inspectors is the most valuable resource we have.
Read more...