JAN1N5661A
Semiconductor Devices and Associated Hardware
SEMICONDUCTOR DEVICE,DIODE
JAN1N5661A
5961 - Semiconductor Devices and Associated Hardware
SEMICONDUCTOR DEVICE,DIODE
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Technical Characteristics
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data on certain environmental and performanc
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Test Data Document
81349-mil-s-19500 specification (includes engineering type bulletins, brochures,etc., that reflect specification type data in specification format; excludes commercial catalogs, industry directories, and similar trade publications, reflecting general type
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Criticality Code Justification
feat
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Overall Length
0.293 inches minimum and 0.357 inches maximum
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Voltage Rating In Volts Per Characteristic
158.0 maximum breakdown voltage, dc
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Inclosure Material
glass
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Terminal Type And Quantity
2 uninsulated wire lead
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Terminal Length
1.000 inches minimum and 1.625 inches maximum
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Features Provided
hermetically sealed case
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Maximum Operating Temp Per Measurement Point
175.0 deg celsius ambient air
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Semiconductor Material
silicon
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Overall Diameter
0.215 inches minimum and 0.235 inches maximum
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Current Rating Per Characteristic
1.00 milliamperes forward current, average peak
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Joint Electronic Device Engineering Council/Jedec/Case Outline Designation
do-13
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End Item Identification
4wasp class lhd; 2m/ate microminiauture automatic test equipment; nimitz class cvn; ticonderoga class cg (47); oliver perry class ffg; tarawa class lha; emory s. land class as; forrestal class cv; spruance class dd (963); arleigh burke class ddg
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Mounting Method
terminal
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Power Rating Per Characteristic
1.0 watts small-signal input power, common-collector major
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Special Features
weapon system essential; junction pattern arrangement: pn
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Specification/Standard Data
81349-mil-s-19500/500 government specification