SN54S287W
Microcircuits, Electronic
MICROCIRCUIT,MEMORY
SN54S287W
5962 - Microcircuits, Electronic
Texas Instruments Incorporated
MICROCIRCUIT,MEMORY
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Technical Characteristics
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Test Data Document
82577-932820 standard (includes industry or association standards, individual manufactureer standards, etc.).
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Word Quantity (Non-Core)
256
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Operating Temp Range
-55.0/+125.0 deg celsius
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Inclosure Configuration
flat pack
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Input Circuit Pattern
10 input
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Storage Temp Range
-65.0/+150.0 deg celsius
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Memory Device Type
rom
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Body Width
0.240 inches minimum and 0.325 inches maximum
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Terminal Surface Treatment
solder
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Body Length
0.440 inches maximum
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Inclosure Material
ceramic and glass
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Terminal Type And Quantity
16 flat leads
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Voltage Rating And Type Per Characteristic
5.5 volts maximum power source
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Output Logic Form
transistor-transistor logic
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Bit Quantity (Non-Core)
1024
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Body Height
0.085 inches maximum
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Features Provided
w/storage and programmed and schottky and bipolar and hermetically sealed and monolithic and positive outputs and 3-state output
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~1
maximum propagation delay time, high to low le
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Time Rating Per Chacteristic
10.00 nanoseconds minimum propagation delay time, high to low level output and 5.00 nanoseconds minimum propagation delay time, low to high level output and 35.00 nanoseconds maximum propagation delay time, low to high level output and 89.00 nanoseconds