SN54181W

Microcircuits, Electronic

MICROCIRCUIT,DIGITAL

SN54181W

5962-01-075-9231

5962 - Microcircuits, Electronic

Texas Instruments Incorporated

MICROCIRCUIT,DIGITAL

ACT NOW! SUBMIT A QUICK QUOTE.

Technical Characteristics

  • Test Data Document

    30003-642as7900 drawing (this is the basic governing drawing, such as a contractor drawing, original equipment manufacturer drawing, etc.; excludes any specification, standard or other document that may be referenced in a basic governing drawing)

  • Unpackaged Unit Weight

    0.4 grams

  • Operating Temp Range

    -55.0/+125.0 deg celsius

  • Inclosure Configuration

    flat pack

  • Features Provided

    positive outputs and edge triggered and darlington-connected and expandable and high speed and monolithic and hermetically sealed and fast carry and w/disable and w/carry lookahead and w/open collector

  • Precious Material

    gold

  • Precious Material And Location

    terminal surfaces gold

  • End Item Identification

    guidance unit,midcourse,type cp-1137/dsq-28

  • Bit Quantity (Non-Core)

    8

  • Body Width

    0.375 inches maximum

  • Storage Temp Range

    -65.0/+150.0 deg celsius

  • Body Length

    0.600 inches maximum

  • Inclosure Material

    ceramic and glass

  • Word Quantity (Non-Core)

    2

  • Input Circuit Pattern

    14 input

  • Design Function And Quantity

    1 arithmetic logic unit

  • Output Logic Form

    transistor-transistor logic

  • Body Height

    0.085 inches maximum

Certified to
AS6081 Methods

Implementing Quality Procurement

A rigorous vendor selection process and vendor management system are essential to ensuring quality.
Read more...

Supplying Quality Products

We take every measure to ensure that we supply quality, authentic parts including a strict vendor selection process and rigorous product inspections..
Read more...

Providing Quality People

Our team of dedicated account managers, procurement professionals and specialized inspectors is the most valuable resource we have.
Read more...