ID100

Semiconductor Devices and Associated Hardware

SEMICONDUCTOR DEVICES,UNITIZED

ID100

5961-01-252-6150

5961 - Semiconductor Devices and Associated Hardware

Calogic Llc

SEMICONDUCTOR DEVICES,UNITIZED

ACT NOW! SUBMIT A QUICK QUOTE.

Technical Characteristics

  • Joint Electronic Device Engineering Council/Jedec/Case Outline Designation

    to-78

  • Inclosure Material

    metal

  • Capacitance Rating In Picofarads

    1.0 maximum all semiconductor device diode

  • Special Features

    all semiconductor device diode junction pattern arrangement: pn

  • Voltage Rating In Volts Per Characteristic

    30.0 minimum breakdown voltage, dc all semiconductor device diode

  • Overall Length

    0.185 inches maximum

  • Component Name And Quantity

    2 semiconductor device diode

  • Terminal Type And Quantity

    4 uninsulated wire lead

  • Terminal Length

    0.500 inches minimum

  • Overall Diameter

    0.370 inches maximum

  • Current Rating Per Characteristic

    10.00 milliamperes maximum reverse current, dc all semiconductor device diode

  • Mounting Method

    terminal

  • Semiconductor Material

    silicon all semiconductor device diode

  • Maximum Operating Temp Per Measurement Point

    150.0 deg celsius ambient air

  • Electrode Internally-Electrically Connected To Case

    collector

  • Power Rating Per Characteristic

    300.0 milliwatts maximum total power dissipation all semiconductor device diode

  • Features Provided

    hermetically sealed case

Certified to
AS6081 Methods

Implementing Quality Procurement

A rigorous vendor selection process and vendor management system are essential to ensuring quality.
Read more...

Supplying Quality Products

We take every measure to ensure that we supply quality, authentic parts including a strict vendor selection process and rigorous product inspections..
Read more...

Providing Quality People

Our team of dedicated account managers, procurement professionals and specialized inspectors is the most valuable resource we have.
Read more...