351-5170-022

Microcircuits, Electronic

MICROCIRCUIT,MEMORY

351-5170-022

5962-01-357-1832

5962 - Microcircuits, Electronic

Rockwell Collins Inc.

MICROCIRCUIT,MEMORY

ACT NOW! SUBMIT A QUICK QUOTE.

Technical Characteristics

  • Operating Temp Range

    -55.0/+125.0 deg celsius

  • Time Rating Per Chacteristic

    45.00 nanoseconds maximum delay

  • Body Height

    0.185 inches maximum

  • Current Rating Per Characteristic

    120.00 milliamperes reverse current, dc absolute

  • Voltage Rating And Type Per Characteristic

    -0.5 volts minimum power source and 7.0 volts maximum power source

  • Memory Device Type

    prom

  • Features Provided

    electrostatic sensitive and burn in and hermetically sealed and monolithic and positive outputs

  • Test Data Document

    96906-mil-std-883 standard (includes industry or association standards, individual manufactureer standards, etc.).

  • Output Logic Form

    complementary-metal oxide-semiconductor logic

  • Storage Temp Range

    -65.0/+150.0 deg celsius

  • Body Width

    0.220 inches minimum and 0.310 inches maximum

  • Inclosure Material

    ceramic

  • Terminal Surface Treatment

    solder

  • Case Outline Source And Designator

    d-9 mil-m-38510

  • Inclosure Configuration

    dual-in-line

  • Word Quantity (Non-Core)

    2048

  • Terminal Type And Quantity

    24 printed circuit

  • Input Circuit Pattern

    14 input

  • Bit Quantity (Non-Core)

    16384

  • Body Length

    1.280 inches maximum

Certified to
AS6081 Methods

Implementing Quality Procurement

A rigorous vendor selection process and vendor management system are essential to ensuring quality.
Read more...

Supplying Quality Products

We take every measure to ensure that we supply quality, authentic parts including a strict vendor selection process and rigorous product inspections..
Read more...

Providing Quality People

Our team of dedicated account managers, procurement professionals and specialized inspectors is the most valuable resource we have.
Read more...