NSN: 5961-00-415-2017

Semiconductor Devices and Associated Hardware

SEMICONDUCTOR DEVICE SET

5961 - Semiconductor Devices and Associated Hardware

SEMICONDUCTOR DEVICE SET

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Technical Characteristics

  • Precious Material And Location

    terminal surfaces gold

  • Current Rating Per Characteristic

    3.00 microamperes zero-gate-voltage source current preset all transistor

  • Terminal Type And Quantity

    3 uninsulated wire lead all transistor and 1 case all transistor

  • Semiconductor Material

    silicon all transistor

  • Internal Junction Configuration

    npn all transistor

  • Test Data Document

    00752-334761 drawing (this is the basic governing drawing, such as a contractor drawing, original equipment manufacturer drawing, etc.; excludes any specification, standard or other document that may be referenced in a basic governing drawing)

  • Overall Width

    0.505 inches maximum all transistor

  • Internal Configuration

    junction contact all transistor

  • Overall Length

    1.003 inches maximum all transistor

  • Inclosure Material

    metal all transistor

  • Component Name And Quantity

    2 transistor

  • Mounting Method

    unthreaded hole all transistor

  • Power Rating Per Characteristic

    5.0 watts small-signal input power, common-collector preset all transistor

  • Maximum Operating Temp Per Measurement Point

    200.0 deg celsius junction all transistor

  • Mounting Facility Quantity

    2 all transistor

  • Component Function Relationship

    matched

  • Overall Height

    0.330 inches maximum all transistor

  • Electrode Internally-Electrically Connected To Case

    collector all transistor

  • Precious Material

    gold

  • ~1

    emitter-to-base, collector open all transistor

  • Voltage Rating In Volts Per Characteristic

    300.0 minimum breakdown voltage, collector-to-base, emitter open all transistor and 300.0 minimum breakdown voltage, collector-to-emitter, with specified resistance between base and emitter all transistor and 5.0 minimum breakdown voltage,

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AS6081 Methods

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