NSN: 5961-01-111-7738

Technical Characteristics

  • ~1

    type data on certain environmental and performa

  • Current Rating Per Characteristic

    10.00 amperes source cutoff current maximum and 4.00 amperes source cutoff current minimum

  • Overall Width

    1.050 inches maximum

  • Semiconductor Material

    silicon

  • Terminal Type And Quantity

    2 pin and 1 case

  • Mounting Facility Quantity

    2

  • Maximum Operating Temp Per Measurement Point

    200.0 deg celsius junction

  • Mounting Method

    unthreaded hole

  • Inclosure Material

    metal

  • Specification/Standard Data

    81349-mil-prf-19500/408 government specification

  • Overall Height

    0.380 inches maximum

  • Test Data Document

    81349-mil-prf-19500 specification (includes engineering type bulletins, brochures,etc., that reflect specification type data in specification format; excludes commercial catalogs, industry directories, and similar trade publications, reflecting general

  • Voltage Rating In Volts Per Characteristic

    7.0 maximum emitter to base voltage, static, collector open and 100.0 maximum collector to base voltage/static/emitter open and 80.0 maximum collector to emitter voltage/static/base open

  • Joint Electronic Device Engineering Council/Jedec/Case Outline Designation

    to-3

  • Electrode Internally-Electrically Connected To Case

    collector

  • Overall Length

    1.573 inches maximum

  • Power Rating Per Characteristic

    85.7 watts small-signal input power, common-collector preset

Certified to
AS6081 Methods

Implementing Quality Procurement

A rigorous vendor selection process and vendor management system are essential to ensuring quality.
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Supplying Quality Products

We take every measure to ensure that we supply quality, authentic parts including a strict vendor selection process and rigorous product inspections..
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Providing Quality People

Our team of dedicated account managers, procurement professionals and specialized inspectors is the most valuable resource we have.
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