NSN: 5962-01-290-2302

Microcircuits, Electronic

MICROCIRCUIT,MEMORY

5962 - Microcircuits, Electronic

MICROCIRCUIT,MEMORY

ACT NOW! SUBMIT A QUICK QUOTE.

Technical Characteristics

  • Test Data Document

    96906-mil-std-883 standard (includes industry or association standards, individual manufactureer standards, etc.).

  • Input Circuit Pattern

    10 input

  • Storage Temp Range

    -65.0/+150.0 deg celsius

  • Case Outline Source And Designator

    d-8 mil-m-38510

  • Body Width

    0.220 inches minimum and 0.310 inches maximum

  • Inclosure Material

    ceramic

  • Overall Height

    0.400 inches maximum

  • Terminal Surface Treatment

    solder

  • Body Length

    1.060 inches maximum

  • Terminal Type And Quantity

    20 printed circuit

  • Inclosure Configuration

    dual-in-line

  • Output Logic Form

    transistor-transistor logic

  • Operating Temp Range

    -55.0/+125.0 deg celsius

  • Voltage Rating And Type Per Characteristic

    -0.5 volts minimum power source and 12.0 volts maximum power source

  • Part Name Assigned By Controlling Agency

    registered and-or gate array

  • Memory Device Type

    pal

  • Body Height

    0.130 inches minimum and 0.185 inches maximum

  • Current Rating Per Characteristic

    90.00 milliamperes reverse current, dc absolute

  • Maximum Power Dissipation Rating

    1.1 watts

  • Time Rating Per Chacteristic

    25.00 nanoseconds maximum delay

  • Features Provided

    bipolar and hermetically sealed and burn in and programmed

Certified to
AS6081 Methods

Implementing Quality Procurement

A rigorous vendor selection process and vendor management system are essential to ensuring quality.
Read more...

Supplying Quality Products

We take every measure to ensure that we supply quality, authentic parts including a strict vendor selection process and rigorous product inspections..
Read more...

Providing Quality People

Our team of dedicated account managers, procurement professionals and specialized inspectors is the most valuable resource we have.
Read more...