NSN: 5962-01-373-3173

Microcircuits, Electronic

MICROCIRCUIT,MEMORY

5962 - Microcircuits, Electronic

MICROCIRCUIT,MEMORY

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Technical Characteristics

  • Criticality Code Justification

    feat

  • Memory Device Type

    pal

  • Nuclear Hardness Critical Feature

    hardened

  • End Item Identification

    milstar

  • Part Name Assigned By Controlling Agency

    microcircuit,programmed pal (ri0)

  • Test Data Document

    96906-mil-std-883 standard (includes industry or association standards, individual manufactureer standards, etc.).

  • Special Features

    electrostatic discharge sens/hardness critical; altered item programmed programmable array logic device using floppy disk containing abel text file and jedec binary file,checksum 86c2 device to be programmed is pn rc205-0346-012

  • Features Provided

    programmed and electrostatic sensitive and radiation hardened and tested to mil-std-883

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